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Finite size scaling

The relatively small number of particles in the field of view has other ramifications. Because the various configurational temperature definitions involve different approximations of order $ 1/N$, we might expect their results to differ from each other and from the actual thermodynamic temperature accordingly. Imaging a substantially larger region of the sample is not feasible. On the other hand, deliberately sub-sampling the field of view allows us to probe the dependence on sample size, for which we can extrapolate the configurational temperatures to the thermodynamic limit.

The data in Fig. 6 were obtained by calculating the configurational temperature with the $ 640 \times 480~\unit{pixel}^2$ field of view reduced by borders of 20, 40, 60, 80, 100, 120, 140, 160 and 180 pixels. The interaction range in this system is $ R = 2\sigma = 14.9~\unit{pixel}$. Reducing the number of particles in this manner substantially changes the estimated temperatures, thereby confirming the importance of finite-size scaling. We fit these results to polynomials in $ 1/N$ with statistical weighting estimated from the area and the interaction range. These weighted fits describe the data very well, so that the extrapolation to $ 1/N=0$ should yield meaningful estimates for the configurational temperatures in the thermodynamic limit. Indeed, the extrapolated results, $ T_{conF} = 0.965$, $ T_{con1} = 0.956$ and $ T_{con2} = 0.976$, agree quite well with each other, and all appear to be consistent with unity. Confirming thermodynamic consistency, however, requires us to assess the configurational temperatures' sensitivity to errors in $ u(r)$.

Figure 6: Finite size scaling of $ T_{conF}$, $ T_{con1}$ and $ T_{con2}$ for the data in Fig. 5, with area-weighted fits to second-, second- and third-order polynomials, respectively.
\begin{figure}\centering
\includegraphics[width=\columnwidth]{T9fit}
\end{figure}


next up previous
Next: Sensitivity to input potential Up: Practical considerations Previous: Influence of measurement errors
David G. Grier 2004-10-01